nSpec® LS

nSpec® LS

Combining optical microscopy, computational super resolution, artificial intelligence, and robotics, Nanotronics is bringing the world’s most advanced microscope to every manufacturing sector.

General

Stage

Travel, typical
200 mm X and Y direction

Centered Load Capability
2.27 kg

Repeatability
+/- 0.5 μm

Step Size
0.04 μm

Travel Flatness
30 μm

Weight
54 kg

Limit Switches
Mechanical, non-adjustable

Wafer Vacuum Chuck (optional)
Adjustable to 50, 75, 100, 150, 
200, or 300 mm

Optics

White Illumination:
LED (other options available)

Brightfield/Darkfield Objectives:
5, 10, 20, or 50x, user selectable

Differential Interference Contrast:
(Normarski)

Features

Stage, Focus, Nosepiece, Illumination, Camera

Manual user operated

Multiple Resolution Settings

Rapid Scanning

Wafer Mosaicing

Customizable Defect Reports

Configuration Options for Wafer Size, Defect type, and Scan Resolution

Sample Chuck Sizes to Meet Specific Needs

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